CDE

Four Point Probe Resistivity Mapping Systems

CDE ResMap systems meet your requirements from the bench top of the research lab to the 24/7 demands of the high volume wafer fab. Whether you're doing CMP, diffusion, ion implant or conductive film research, CDE has a ResMap system that will meet your process or development metrology needs and your budget.

ResMap systems deliver advanced metrology that is accurate, repeatable, fast and affordable. The new multi-probe capabilities of the 400-Series of ResMap systems make them the most versatile, cost-effective metrology systems available today.